Abstract: The Electron Probe Micro-analyzer (EPMA) image, as a key source of the sample micro-morphological elements, has already been widely used in sophisticated analytical techniques. After studying on the situation of the EPMA application and its characteristics, as well as adaptive multi-scale analysis characteristics of Bandelets transform, a second generation Bandelets transform is proposed in this paper. The experiment shows that the second generation Bandelets transform, which has better practical value, can support rapid and robust image decomposition and provide near-linear algorithm.

Key words: computer application, image fusion, Bandelets transform, electron probe micro-analyzer, multi-scale analysis